In this study, CuO nanostructured films conjunction with metal doping have been deposited onto soda lime glass (SLG) substrate by method of spin coating at different doping concentration in solution (0%, 2% and 4%). X-ray diffraction (XRD) patterns for copper oxide films conjunction with Al doping demonstrated that the films have polycrystalline structure and have preferential growth in (-111) and (200) directions. Calculated dislocation density value of (-111) plane is changed between 3.7 x 1014 and 5.83 x 1014 m-2 and 83.7 x 1014 and 50.6 x 1014 m-2 for (200) owing to the expansion of structural parameters with Al dopant content in solution. In order to investigate surface morphology, we used an atomic force microscopy (AFM). The obtained results from AFM revealed that samples are comparatively smooth in the valley area while many crystals-like structures are seen in the hill area. In order to examine absorbance, energy band gap and transmittance value of Al doped CuO films, we used a UV-Vis measurements system in the range of 1100-300 nm at temperature of 273 K. The obtained samples have high absorption in the region of UV-Vis and have a high affinity for UV light. It can be said that the change in the absorption value is a result of the different crystal nature of the samples. Energy band gap value of Al:CuO thin films changed between 1.98 and 2.07 eV.